Loading

Research Article Open Access
Volume 1 | Issue 1 | DOI: https://doi.org/10.33696/Nanotechnol.1.005

Structural Characterization of Commercial Graphite and Graphene Materials

  • 1Department of Physics and Astronomy, Curtin University, GPO Box U1987, Perth, WA 6845, Australia
  • 2Department of Basic Sciences, College of Education, Imam Abdulrahman Bin Faisal University, P. O. Box 2375, Dammam 31451, Saudi Arabia
  • 3239 Tamby Court, Southern River, WA 6110, Australia
+ Affiliations - Affiliations

Corresponding Author

It-Meng Low, j.low@curtin.edu.au

Received Date: May 04, 2020

Accepted Date: May 27, 2020

Abstract

Graphene is often referred to as bi-, tri- or few-layered (4 to 10 layers), despite it being single-layered. Two commercial graphite samples (G and GE) and three commercial graphene samples (G1, G2, and G3) were characterized by Raman spectroscopy, scanning electron microscopy, X-ray diffractometry and atomic force microscopy. The structural similarities and differences between graphite and graphene were compared with literature information. A mixture of hexagonal (2H) and rhombohedral (3R) phases were identified in samples G1, G2, G3, and GE by X-ray diffraction. Graphene is observed to differ from graphite-based on Raman spectroscopic studies at room temperature. Atomic force microscopy on graphene films at 514 nm radiation showed ~ 3, 7, and 9 layers for G1, G2, and G3, respectively.

Keywords

Graphene; Graphite; Crystal structure; Nanomaterials; Raman spectroscopy; Atomic force microscopy; X-ray diffractometry; Scanning electron microscopy

Author Information X